Spatial coherency of the synchrotron radiation at the visible light region and its application for the electron beam profile measurement

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High Energy Accelerator Research, Organization, Ibaraki, Japan [1 ]
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Proc IEEE Part Accel Conf | / 766-768期
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Citterut-Zernike's theorem - Electron beam profile measurement;
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摘要：
A spatial coherencies of SR beam at visible light region were measured both σ and π-polarized components at Photon Factory. A wave-front division type polarized interferometer was designed and constructed for this experiment. Interferograms were observed clearly in the vertical direction. π phase difference of the interference fringe was observed between interferograms corresponding to σ and π-polarized components. Degree of spatial coherence was measured and by means of the van Citterut-Zernike's theorem, a vertical beam profile was obtained by the Fourier transform of the degree of spatial coherence.
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