GaN evaporation and enhanced diffusion of Ar during high-temperature ion implantation

被引:0
|
作者
机构
[1] [1,Usov, I.
[2] Parikh, N.
[3] Kudriavtsev, Y.
[4] Asomoza, R.
[5] Reitmeier, Z.
[6] Davis, R.
来源
Usov, I. (iusov@lanl.gov) | 1600年 / American Institute of Physics Inc.卷 / 93期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
(Edited Abstract)
引用
收藏
相关论文
共 50 条
  • [1] GaN evaporation and enhanced diffusion of Ar during high-temperature ion implantation
    Usov, I
    Parikh, N
    Kudriavtsev, Y
    Asomoza, R
    Reitmeier, Z
    Davis, R
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (09) : 5140 - 5142
  • [2] RADIATION-ENHANCED DIFFUSION DURING HIGH-TEMPERATURE ION-IMPLANTATION
    SCHORK, R
    PICHLER, P
    KLUGE, A
    RYSSEL, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 499 - 503
  • [3] Reverse-annealing phenomenon during the high-temperature implantation of Ar+ into GaN
    Usov, IO
    Parikh, NR
    Thomson, D
    Davis, RF
    GAN AND RELATED ALLOYS-2001, 2002, 693 : 641 - 646
  • [4] Diffusion of boron and phosphorus in silicon during high-temperature ion implantation
    Gadiyak, GV
    SEMICONDUCTORS, 1997, 31 (04) : 321 - 325
  • [5] Diffusion of boron and phosphorus in silicon during high-temperature ion implantation
    G. V. Gadiyak
    Semiconductors, 1997, 31 : 321 - 325
  • [6] Transient enhanced diffusion of aluminum in SiC during high temperature ion implantation
    Usov, IO
    Suvorova, AA
    Sokolov, VV
    Kudryavtsev, YA
    Suvorov, AV
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) : 6039 - 6042
  • [7] NUMERICAL MODELING OF THE DIFFUSION OF BORON AND PHOSPHORUS IN SILICON DURING HIGH-TEMPERATURE ION-IMPLANTATION
    ALEKSANDROV, LN
    BONDAREVA, TV
    KACHURIN, GA
    TYSCHENKO, IE
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1991, 25 (02): : 137 - 139
  • [8] Mechanism of enhanced diffusion of aluminum in 6H-SiC in the process of high-temperature ion implantation
    Usov, IO
    Suvorova, AA
    Sokolov, VV
    Kudryavtsev, YA
    Suvorov, AV
    ATOMISTIC MECHANISMS IN BEAM SYNTHESIS AND IRRADIATION OF MATERIALS, 1998, 504 : 141 - 146
  • [9] Dose and implantation temperature influence on disorder produced by Ar+ ion implantation into GaN
    Usov, I
    Parikh, N
    Thomson, D
    Reitmeier, Z
    Davis, R
    Kudriavtsev, Y
    Asomoza, R
    IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, 2003, : 605 - 609
  • [10] ENHANCED DIFFUSION OF HIGH-TEMPERATURE ION-IMPLANTED ANTIMONY INTO SILICON
    GAMO, K
    MASUDA, K
    NAMBA, S
    APPLIED PHYSICS LETTERS, 1970, 17 (09) : 391 - +