MODULAR DEEP LEVEL TRANSIENT SPECTROSCOPY.

被引：0
|
作者：
Anon
机构：
来源：
Solid State Technology | 1983年 / 26卷 / 09期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
4
引用
收藏
页码：79 / 80
相关论文
共 50 条
  • [1] NOVEL METHOD TO DETECT NONEXPONENTIAL TRANSIENTS IN DEEP LEVEL TRANSIENT SPECTROSCOPY.
    Thurber, W.Robert
    Forman, Richard A.
    Phillips, Willie E.
    1600, (53):
  • [2] STUDY OF SLOW DEGRADATION IN GaAlAs LEDs BY DEEP-LEVEL TRANSIENT SPECTROSCOPY.
    Kondo, Kazuo
    Yamakoshi, Shigenobu
    Kotani, Tsuyoshi
    Fujitsu Scientific and Technical Journal, 1981, 17 (03): : 105 - 120
  • [3] STUDY OF METAL-SEMICONDUCTOR INTERFACE STATES USING DEEP LEVEL TRANSIENT SPECTROSCOPY.
    Zhang, H.
    Aoyagi, Y.
    Iwai, S.
    Namba, S.
    Applied physics. A, Solids and surfaces, 1987, A 44 (03): : 273 - 277
  • [4] DEEP ELECTRON TRAPS IN AlAs-GaAs SUPERLATTICES AS STUDIED BY DEEP-LEVEL TRANSIENT SPECTROSCOPY.
    Kobayashi, Kikuo
    Morita, Masahiko
    Kamata, Norihiko
    Suzuki, Takeo
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1988, 27 (02): : 192 - 195
  • [5] Analysis of Defects of PV Solar Modules Using Deep Level Transient Spectroscopy. Feasability and Limits.
    Zaraket, Jean
    Kokanyan, Ninel
    Aillerie, Michel
    Salame, Chafic
    TECHNOLOGIES AND MATERIALS FOR RENEWABLE ENERGY, ENVIRONMENT AND SUSTAINABILITY (TMREES20), 2020, 2307
  • [6] Deep level studies of GaN by deep level transient spectroscopy
    Saha, SL
    Khan, MRH
    Sawaki, N
    INDIAN JOURNAL OF PHYSICS, 2005, 79 (05) : 491 - 495
  • [7] Isolated Ti in Si: Deep level transient spectroscopy, minority carrier transient spectroscopy, and high-resolution Laplace deep level transient spectroscopy studies
    Scheffler, L.
    Kolkovsky, Vl.
    Weber, J.
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (04)
  • [8] AN IMPROVED DEEP LEVEL TRANSIENT SPECTROSCOPY METHOD
    HJALMARSON, HP
    SAMARA, GA
    FARMER, JW
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (05) : 1801 - 1804
  • [9] Scanning ion deep level transient spectroscopy
    Laird, JS
    Bardos, RA
    Jagadish, C
    Jamieson, DN
    Legge, GJF
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 158 (1-4): : 464 - 469
  • [10] SCANNING DEEP LEVEL TRANSIENT SPECTROSCOPY (SDLTS)
    BREITENSTEIN, O
    HEYDENREICH, J
    SCANNING, 1985, 7 (06) : 273 - 289
12345