共 50 条
- [1] X-ray stress measurement method for single crystal with unknown stress-free lattice parameter JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (5A): : 2876 - 2880
- [2] X-ray stress measurement of silicon single crystal MATERIALS SCIENCE RESEARCH INTERNATIONAL, 2000, 6 (04): : 255 - 262
- [4] Development of stress-free Laue diffraction crystal for X-ray beam splitting INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING, ICOPEN 2023, 2024, 13069
- [5] LATTICE STRAINS AND X-RAY STRESS MEASUREMENT TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME, 1961, 221 (05): : 962 - 967
- [6] Measurement of residual stress in single-crystal SiC by X-ray diffraction method Lixue Xuebao/Chinese Journal of Theoretical and Applied Mechanics, 2022, 54 (01): : 147 - 153
- [7] X-ray analysis of residual stresses and stress-free lattice parameters in thin gradient coatings EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2000, 321-3 : 81 - 86
- [9] Residual stress estimation of Ti casting alloy by X-ray single crystal measurement method NEUTRON AND X-RAY SCATTERING IN MATERIALS SCIENCE AND BIOLOGY, 2008, 989 : 96 - +
- [10] VALIDATION OF THE X-RAY STRESS MEASUREMENT METHOD ADVANCES IN MATERIALS SCIENCE, 2014, 14 (04): : 102 - 109