SELF-TEST ac ISOLATION.

被引：0
|
作者：
Anon
机构：
来源：
IBM technical disclosure bulletin | 1985年 / 28卷 / 01期
关键词：
CAPTURING STORAGE ELEMENTS - CLOCK PULSE - SELF-TEST AC ISOLATION;
D O I：
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摘要：
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页码：49 / 51
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