Study of Nicalon-based ceramic fibres and powders by EXAFS spectrometry, X-ray diffractometry and some additional methods

被引：0
|
作者：
机构：
[1] Laffon, C.
[2] Flank, A.M.
[3] Lagarde, P.
[4] Laridjani, M.
[5] Hagege, R.
[6] Olry, P.
[7] Cotteret, J.
[8] Dixmier, J.
[9] Miquel, J.L.
[10] Hommel, H.
[11] Legrand, A.P.
来源：
Laffon, C. | 1600年 / 24期
关键词：
Ceramic Materials;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] STUDY OF NICALON-BASED CERAMIC FIBERS AND POWDERS BY EXAFS SPECTROMETRY, X-RAY-DIFFRACTOMETRY AND SOME ADDITIONAL METHODS
    LAFFON, C
    FLANK, AM
    LAGARDE, P
    LARIDJANI, M
    HAGEGE, R
    OLRY, P
    COTTERET, J
    DIXMIER, J
    MIQUEL, JL
    HOMMEL, H
    LEGRAND, AP
    JOURNAL OF MATERIALS SCIENCE, 1989, 24 (04) : 1503 - 1512
  • [2] A study of the structural characteristics of fluorite crystals using methods of x-ray diffractometry and topography
    Kablis, GN
    Punegov, VI
    Shilov, SV
    Petrakov, AP
    INDUSTRIAL LABORATORY, 2000, 66 (11): : 726 - 728
  • [3] Microstructural study of SnO2-based nanoparticles by X-ray diffractometry
    Chenari, Hossein Mahmoudi
    Sanchez-Bajo, Florentino
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2016, 49 : 15 - 19
  • [4] Application of some chemometric methods to energy dispersive X-ray fluorescence spectrometry
    Schimidt, F
    Bueno, MIMS
    Poppi, RJ
    QUIMICA NOVA, 2002, 25 (6A): : 949 - 956
  • [5] Study of multilayered SiGe semiconductor structures by X-ray diffractometry, grazing-incidence X-ray reflectometry, and secondary-ion mass spectrometry
    P. A. Yunin
    Yu. N. Drozdov
    M. N. Drozdov
    S. A. Korolev
    D. N. Lobanov
    Semiconductors, 2013, 47 : 1556 - 1561
  • [6] Study of Multilayered SiGe Semiconductor Structures by X-Ray Diffractometry, Grazing-Incidence X-Ray Reflectometry, and Secondary-Ion Mass Spectrometry
    Yunin, P. A.
    Drozdov, Yu. N.
    Drozdov, M. N.
    Korolev, S. A.
    Lobanov, D. N.
    SEMICONDUCTORS, 2013, 47 (12) : 1556 - 1561
  • [7] Study of the formation mechanism of sol-gel derived SBN powders using Raman spectroscopy and X-ray diffractometry
    Ho, MMT
    Mak, CL
    Wong, KH
    FERROELECTRICS, 1999, 231 (1-4) : 843 - 848
  • [8] Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods
    Marchenkov, N. V.
    Blagov, A. E.
    Lomonov, B. A.
    Pisarevsky, Yu. V.
    Kovalchuk, M. V.
    CRYSTALLOGRAPHY REPORTS, 2013, 58 (02) : 201 - 203
  • [9] Study of the defect structure of paratellurite crystal using multiwave diffraction and normal X-ray diffractometry methods
    N. V. Marchenkov
    A. E. Blagov
    B. A. Lomonov
    Yu. V. Pisarevsky
    M. V. Kovalchuk
    Crystallography Reports, 2013, 58 : 201 - 203
  • [10] Study of the formation mechanism of sol-gel derived SBN powders using Raman spectroscopy and X-ray diffractometry
    Ho, Melanie Man Tak
    Mak, Chee Leung
    Wong, Kin Hung
    Ferroelectrics, 1999, 231 (1 -4 pt 3):
12345