Study on electronic speckle patter interferometry technique for simultaneous measurement of whole in-plane displacement with the polarization of laser

被引:0
|
作者
Fan, Hua [1 ]
Song, Yuanhe [1 ]
Tan, Yushan [1 ]
机构
[1] Xi'an Jiaotong Univ, Xi'an, China
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
(Edited Abstract)
引用
收藏
页码:127 / 130
相关论文
共 50 条
  • [1] IN-PLANE DISPLACEMENT MEASUREMENT BY SPECKLE INTERFEROMETRY
    DEBACKER, LC
    NON-DESTRUCTIVE TESTING, 1975, 8 (04): : 177 - 180
  • [2] A study on the measurement of in-plane displacement at high temperature by electronic speckle pattern interferometry method
    Kim, KS
    Kim, HT
    Cha, YH
    Jung, HC
    Jarng, SS
    Kim, JY
    Yang, SP
    REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, 1998, : 1801 - 1808
  • [3] Simultaneous measurement with one-capture of the two in-plane components of displacement by electronic speckle pattern interferometry
    Martinez, Amalia
    Rayas, J. A.
    Meneses-Fabian, Cruz
    Anguiano-Morales, Marcelino
    OPTICS COMMUNICATIONS, 2008, 281 (17) : 4291 - 4296
  • [4] Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement
    Martínez-Celorio, RA
    Barrientos, B
    Sanchez-Marín, FJ
    López, LM
    Rayas, JA
    OPTICS COMMUNICATIONS, 2002, 208 (1-3) : 17 - 24
  • [5] A novel fiber illumination system for in-plane displacement measurement in electronic speckle pattern interferometry
    Rodriguez, D
    Dapena, M
    Gallas, M
    Abeleira, MT
    Suárez, D
    Moreno, V
    INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS, 2000, : 267 - 274
  • [6] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY FOR SIMULTANEOUS MEASUREMENT OF OUT-OF-PLANE DISPLACEMENT AND SLOPE
    MOHAN, NK
    SALDNER, H
    MOLIN, NE
    OPTICS LETTERS, 1993, 18 (21) : 1861 - 1863
  • [7] The Extension of the Electronic Speckle Photography to the Measurement of In-Plane Displacement
    Mohamed Abdel Hady
    Niveen Abdel Maaboud
    Mohamed El Okr
    Mohamed El Bahrawi
    MAPAN, 2018, 33 : 377 - 384
  • [8] The Extension of the Electronic Speckle Photography to the Measurement of In-Plane Displacement
    Hady, M. Abdel
    Maaboud, N. Abdel
    El Okr, M.
    El Bahrawi, M.
    MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA, 2018, 33 (04): : 377 - 384
  • [9] In-plane strains measurement by using the electronic speckle pattern interferometry
    Koung-Suk Kim
    Hyun-Chul Jung
    Ki-Soo Kang
    Jong-Kook Lee
    Soon-Suck Jang
    Chung-Ki Hong
    KSME International Journal, 1998, 12 : 215 - 222
  • [10] In-plane strains measurement by using the electronic speckle pattern interferometry
    Kim, KS
    Jung, HC
    Kang, KS
    Lee, JK
    Jang, SS
    Hong, CK
    KSME INTERNATIONAL JOURNAL, 1998, 12 (02): : 215 - 222