共 50 条
- [1] TRANSMISSION ELECTRON-MICROSCOPY OF EPITAXIAL METALLIC COMPOUNDS ON GAAS (NI-GAAS SYSTEM) JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (03): : A23 - A23
- [2] A STUDY OF EPITAXIC METALLIC COMPOUNDS ON GAAS (NI-GAAS SYSTEM) USING TRANSMISSION ELECTRON-MICROSCOPY VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1988, 43 (241): : 265 - 266
- [10] Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy Semiconductors, 2016, 50 : 1753 - 1758