Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling

被引：0

作者：

Chatterjee, Abhijit ^{[1
]}

Abraham, Jacob A. ^{[1
]}

机构：

[1] General Electric Research and, Development Cent, Schenectady, United States

来源：

Journal of Electronic Testing: Theory and Applications (JETTA) | 1991年 / 2卷 / 04期

关键词：

Arithmetic Functions - Built-In Self-Tests - Design-For-Testability - Iterative Logic Arrays;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：351 / 372

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