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- [1] Extension of rotating-analyzer ellipsometry to generalized ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (04) : 875 - 883Schubert, MRheinlander, BWoollam, JAJohs, BHerzinger, CM
- [2] Extension of rotating-analyzer ellipsometry to generalized ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2J Opt Soc Am A, 4 (875-883):Faculty of Physics and Geoscience, Department of Semiconductor Physics, University of Leipzig, Linnéstrasse 5, Leipzig 04103, Germany不详不详
- [3] Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometryOPTICAL DIAGNOSTIC METHODS FOR INORGANIC MATERIALS II, 2000, 4103 : 19 - 29Tiwald, TESchubert, M
- [4] Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)OPTICS LETTERS, 1997, 22 (23) : 1808 - 1810Jellison, GEModine, FABoatner, LA
- [5] Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: Rutile (TiO2)Opt. Lett., 23 (1808-1810):Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030, United States
- [8] Investigation of variable incidence angle spectroscopic ellipsometry for determination of below band gap uniaxial dielectric functionSILICON CARBIDE AND RELATED MATERIALS, ECSCRM2000, 2001, 353-356 : 417 - 420Kildemo, MHunderi, O
- [9] Determination of complex optical constants of uniaxial HgI2 by spectroscopic conventional and generalized ellipsometryPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1999, 175 (01): : 413 - 419Naciri, AEJohann, LKleim, RSieskind, MAmann, M
- [10] Determination of the dielectric function of MnIn2S4 single crystals by spectroscopic ellipsometryJOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2012, 73 (06) : 720 - 723Leon, M.Levcenko, S.Bodnar, I.Serna, R.Merino, J. M.Guc, M.Friedrich, E. J.Arushanov, E.