共 14 条
- [1] Probe radius compensated by the multi-cross product method in freeform surface measurement with touch trigger probe CMM INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2003, 21 (10-11): : 902 - 909
- [2] Probe Radius Compensated by the Multi-Cross Product Method in Freeform Surface Measurement with Touch Trigger Probe CMM The International Journal of Advanced Manufacturing Technology, 2003, 21 : 902 - 909
- [4] Probe Radius Compensation Based on Aspherical Surface Reconstruction in CMM Profile Measurement SPACE OPTICS, TELESCOPES, AND INSTRUMENTATION (AOPC 2019), 2019, 11341
- [6] Method of Probe Radius Compensation for Optical Complex Surface Measurement 2019 5TH INTERNATIONAL CONFERENCE ON MECHANICAL AND AERONAUTICAL ENGINEERING (ICMAE 2019), 2020, 751
- [8] A Multi-probe Measurement Method to Evaluate the Yaw and Straightness Errors of XY Stage on High Precision CMM ADVANCED PRECISION ENGINEERING, 2010, 447-448 : 590 - +
- [9] Improvement of measurement resolution of a mechanical touch-trigger probe method for static radial runout measurements based on digital image correlation The International Journal of Advanced Manufacturing Technology, 2019, 105 : 3127 - 3136
- [10] Improvement of measurement resolution of a mechanical touch-trigger probe method for static radial runout measurements based on digital image correlation INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2019, 105 (7-8): : 3127 - 3136