Separation of charge transfer and surface recombination processes by simultaneous measurement of photocurrent and excess microwave conductivity profiles of Si(111) in NH4F

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[1] Lewerenz, H.J.
[2] Schlichthorl, G.
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Lewerenz, H.J. | 1600年 / American Inst of Physics, Woodbury, NY, United States卷 / 75期
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Semiconducting silicon;
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