Development of sampling oscilloscopes will trigger ultra-wide band measurement

被引：0
|
作者：
Sakai, Satoshi [1 ]
机构：
[1] Iwatsu Electric Co, Japan
来源：
JEE. Journal of electronic engineering | 1988年 / 25卷 / 257期
关键词：
Electric Measurements--Automation - Integrated Circuits--Inspection - Logic Circuits--Inspection;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We will take a look at sampling oscilloscopes with respect to their application to the evaluation and inspection of logic ICs. From there we will proceed to examine the frequency range required of measuring instruments and outline the sampling oscilloscope SAS-8130A, particularly with respect to its automatic measuring functions including its pulse parameter automatic measurement, sequence, waveform search, digital comparator, and external interfaces.
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页码：46 / 48
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