SWITCHING MECHANISM IN THE HETEROSTRUCTURE HOT-ELECTRON DIODE.

被引:0
|
作者
Higman, T.K. [1 ]
Higman, J.M. [1 ]
Emanuel, M.A. [1 ]
Hess, K. [1 ]
Coleman, J.J. [1 ]
Kolodzey, J. [1 ]
机构
[1] Univ of Illinois, Urbana, IL, USA, Univ of Illinois, Urbana, IL, USA
关键词
D O I
暂无
中图分类号
学科分类号
摘要
SEMICONDUCTOR DIODES
引用
收藏
相关论文
共 50 条
  • [1] THE SWITCHING MECHANISM IN THE HETEROSTRUCTURE HOT-ELECTRON DIODE
    HIGMAN, TK
    HIGMAN, JM
    EMANUEL, MA
    HESS, K
    COLEMAN, JJ
    KOLODZEY, J
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (11) : 2381 - 2381
  • [2] CURRENT SWITCHING AND INSTABILITY IN A HETEROSTRUCTURE HOT-ELECTRON DIODE
    REKLAITIS, A
    MYKOLAITIS, G
    SOLID-STATE ELECTRONICS, 1994, 37 (01) : 147 - 152
  • [3] Voltage switching and oscillations in a single barrier heterostructure hot-electron diode
    Krotkus, A
    Reklaitis, A
    Geizutis, A
    Asche, M
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (07) : 3980 - 3985
  • [4] OSCILLATORY INSTABILITY IN THE HETEROSTRUCTURE HOT-ELECTRON DIODE
    WACKER, A
    SCHOLL, E
    APPLIED PHYSICS LETTERS, 1991, 59 (14) : 1702 - 1704
  • [5] ROOM-TEMPERATURE SWITCHING AND NEGATIVE DIFFERENTIAL RESISTANCE IN THE HETEROSTRUCTURE HOT-ELECTRON DIODE
    HIGMAN, TK
    MILLER, LM
    FAVARO, ME
    EMANUEL, MA
    HESS, K
    COLEMAN, JJ
    APPLIED PHYSICS LETTERS, 1988, 53 (17) : 1623 - 1625
  • [6] Temperature persistent bistability and threshold switching in a single barrier heterostructure hot-electron diode
    Stasch, R
    Hey, R
    Asche, M
    Wacker, A
    Scholl, E
    JOURNAL OF APPLIED PHYSICS, 1996, 80 (06) : 3376 - 3380
  • [7] THEORETICAL AND EXPERIMENTAL INVESTIGATIONS OF THE HETEROSTRUCTURE HOT-ELECTRON DIODE
    EMANUEL, MA
    HIGMAN, TK
    HIGMAN, JM
    KOLODZEY, JM
    COLEMAN, JJ
    HESS, K
    SOLID-STATE ELECTRONICS, 1988, 31 (3-4) : 589 - 592
  • [8] THEORETICAL AND EXPERIMENTAL-ANALYSIS OF THE SWITCHING MECHANISM IN HETEROSTRUCTURE HOT-ELECTRON DIODES
    HIGMAN, TK
    HIGMAN, JM
    EMANUEL, MA
    HESS, K
    COLEMAN, JJ
    JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) : 1495 - 1499
  • [9] MICROWAVE FREQUENCY OPERATION OF THE HETEROSTRUCTURE HOT-ELECTRON DIODE
    KOLODZEY, J
    LASKAR, J
    HIGMAN, TK
    EMANUEL, MA
    COLEMAN, JJ
    HESS, K
    IEEE ELECTRON DEVICE LETTERS, 1988, 9 (06) : 272 - 274
  • [10] Current instability in the single barrier heterostructure hot-electron diode
    Krotkus, A
    Reklaitis, A
    Geizutis, A
    Asche, M
    Stasch, R
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1997, 204 (01): : 504 - 506