Defects in SiO2/Si structures probed by using a monoenergetic positron beam

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Uedono, Akira [1 ]
Wei, Long [1 ]
Tanigawa, Shoichiro [1 ]
Ohji, Yuzuru [1 ]
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[1] Univ of Tsukuba, Ibaraki, Japan
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| 1600年 / JJAP, Minato-ku, Japan卷 / 33期
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