Theoretical substantiation of methods for measuring impedances of one-ports and s-parameters of two-ports

被引：0
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作者：
Balyko, A.K.
Gusel'nikov, N.A.
Pchelin, V.A.
Yusupova, N.I.
机构：
来源：
Radiotekhnika i Elektronika | 2001年 / 46卷 / 02期
关键词：
Electromagnetic wave reflection - Electromagnetic wave transmission - Measurements - Microwaves;
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摘要：
A method for the determination of the input admittance of a two-port (one-port) from measured moduli of the reflection and transmission coefficients is proposed for two versions of the measurement circuit. The results of measuring the characteristics of a 3P608B transistor in the 14.5-15.5 GHz frequency band are presented. A method for determining the S-parameters from the measured moduli of the reflection and transmission coefficients is theoretically substantiated.
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页码：252 / 256
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