Automatic netlist extraction for measurement-based characterization of off-chip interconnect

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Univ of Washington, Seattle, United States [1 ]
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IEEE Transactions on Microwave Theory and Techniques | 1997年 / 45卷 / 10 pt 2期
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Number:; MIP; 9257279AM04; Acronym:; NSF; Sponsor: National Science Foundation;
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页码：1934 / 1940
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