Low temperature symmetry change of C60: A high resolution X-ray diffraction investigation

被引：0
|
作者：
Universite de Lille, Villeneuve d'Ascq, France [1 ]
机构：
来源：
Solid State Commun | / 5卷 / 319-321期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] The low temperature symmetry change of C-60: A high resolution X-ray diffraction investigation
    Willart, JF
    Carpentier, L
    Descamps, M
    Krane, HG
    Sauvajol, JL
    SOLID STATE COMMUNICATIONS, 1997, 101 (05) : 319 - 321
  • [2] Time-resolved X-ray diffraction study of C60 at high pressure and temperature
    Horikawa, T
    Suito, K
    Kobayashi, M
    Onodera, A
    PHYSICS LETTERS A, 2001, 287 (1-2) : 143 - 151
  • [3] Raman, x-ray diffraction, and photoemission measurements on C60 and doped C60 films
    Sharma, SC
    Ha, B
    Rhee, JH
    Li, Y
    FRONTIERS OF HIGH PRESSURE RESEARCH II: APPLICATION OF HIGH PRESSURE TO LOW-DIMENSIONAL NOVEL ELECTRONIC MATERIALS, 2001, 48 : 493 - 505
  • [4] SOLVATED C60 AND C60/C70 AND THE LOW-RESOLUTION SINGLE-CRYSTAL X-RAY STRUCTURE OF C60
    GORUN, SM
    CREEGAN, KM
    SHERWOOD, RD
    COX, DM
    DAY, VW
    DAY, CS
    UPTON, RM
    BRIANT, CE
    JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1991, (21) : 1556 - 1558
  • [5] X-ray diffraction of Na4C60 at low temperature under high pressure
    Takabayashi, Y
    Kubozono, Y
    Fujiki, S
    Iwasa, Y
    Kashino, S
    ELECTRONIC PROPERTIES OF NOVEL MATERIALS-MOLECULAR NANOSTRUCTURES, 2000, 544 : 124 - 127
  • [6] X-ray diffraction study of crystallographic parameters and Debye temperature of C60 single crystals
    Shebanovs, L
    Maniks, J
    Kalnacs, J
    JOURNAL OF CRYSTAL GROWTH, 2002, 234 (01) : 202 - 206
  • [7] X-ray powder diffraction and phase composition of fullerene C60
    Korolev, YM
    Kozlov, VV
    Polikarpov, VM
    Antipov, EM
    DOKLADY PHYSICAL CHEMISTRY, 2000, 374 (1-3) : 167 - 171
  • [8] In situ x-ray diffraction study of C60 polymerization at high pressure and temperature -: art. no. 165409
    Talyzin, AV
    Dubrovinsky, LS
    Oden, M
    Le Bihan, T
    Jansson, U
    PHYSICAL REVIEW B, 2002, 66 (16)
  • [9] Analysis of diffuse background on the X-ray diffraction pattern of fullerite C60
    L. A. Aleshina
    A. D. Fofanov
    R. N. Osaulenko
    L. A. Lugovskaya
    Crystallography Reports, 2005, 50 : 384 - 388
  • [10] Analysis of diffuse background on the x-ray diffraction pattern of Fullerite C60
    Aleshina, LA
    Fofanov, AD
    Osaulenko, RN
    Lugovskaya, LA
    CRYSTALLOGRAPHY REPORTS, 2005, 50 (03) : 384 - 388
12345