Electro-optic-based two-dimensional THz near-field imaging

被引：0
|
作者：
Chen, Q. [1 ]
Jiang, Z. [1 ]
Zhang, X.-C. [1 ]
机构：
[1] Rensselaer Polytechnic Inst, Troy, NY, United States
来源：
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest | 2000年
关键词：
Aberrations - Cameras - Diffraction - Electrooptical effects - Image quality - Light propagation - Scanning - Tomography - Two dimensional;
D O I：
10.1109/cleo.2000.907345
中图分类号：
学科分类号：
摘要：
THz near-field measurement is an effective way to improve the spatial resolution of imaging system. It is proved experimentally as well as theoretically that the THz waveform measured in this reflection geometry is the same as that in the transmission geometry. The reason is that the EO signal from the counter-propagating THz beam and probe beam is negligible. The object can then be located right in front of the EO crystal, and realize the near-field measurement of THz field.
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