Analysis of semiconductor surface phonons by Raman spectroscopy

被引:0
|
作者
Esser, N. [1 ]
机构
[1] Technische Universität Berlin, Inst. für Festkörperphysik, Hardenbergstr. 36, D-10623 Berlin, Germany
关键词
Semiconductor surface phonons;
D O I
暂无
中图分类号
学科分类号
摘要
Only recently Raman spectroscopy (RS) has advanced into the study of surface phonons from clean and adsorbate-covered semiconductor surfaces. RS allows the determination of eigenfrequencies as well as symmetry selection rules of surface phonons, by k-conservation limited to the Brillouin zone-center, and offers a significantly higher spectral resolution than standard surface science techniques such as high-resolution electron energy loss spectroscopy. Moreover, surface electronic states become accessible via electron-phonon coupling. In this article the fundamentals of Raman scattering from surface phonons are discussed and its potential illustrated by considering two examples, namely Sb-monolayer-terminated and clean InP(110) surfaces. Both are very well understood with respect to their atomic and electronic structure and thus may be regarded as model systems for heteroterminated and clean semiconductor surfaces. In both cases, localized surface phonons as well as surface resonances are detected by Raman spectroscopy. The experimental results are compared with surface modes predicted by theoretical calculations. On InP(110), due to the high spectral resolution of Raman spectroscopy, several surface modes predicted by theory can be experimentally verified. Surface electronic transitions are detected by changing the energy of the exciting laser light indicating resonances in the RS cross section.
引用
收藏
页码:507 / 518
相关论文
共 50 条
  • [1] Analysis of semiconductor surface phonons by Raman spectroscopy
    Esser, N
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (05): : 507 - 518
  • [2] Analysis of semiconductor surface phonons by Raman spectroscopy
    N. Esser
    Applied Physics A, 1999, 69 : 507 - 518
  • [3] High-resolution analysis of semiconductor surface phonons by Raman spectroscopy
    Esser, N
    Hinrichs, K
    Power, JR
    Richter, W
    SURFACE SCIENCE, 1999, 427-28 : 44 - 52
  • [4] High-resolution analysis of semiconductor surface phonons by Raman spectroscopy
    Esser, N.
    Hinrichs, K.
    Power, J.R.
    Richter, W.
    Surface Science, 1999, 427-428 : 44 - 52
  • [5] Raman spectroscopy of phonons in optically confined semiconductor nanostructures
    Fainstein, A
    Jusserand, B
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2003, 18 (10) : S377 - S385
  • [6] SURFACE RAMAN-SPECTROSCOPY AND LINESHAPE ANALYSIS OF MONOLAYER SURFACE PHONONS OF THE ANTHRACENE CRYSTAL
    ORRIT, M
    BERNARD, J
    TURLET, JM
    KOTTIS, P
    CHEMICAL PHYSICS LETTERS, 1983, 95 (4-5) : 315 - 321
  • [7] Surface phonons of InP(110) studied by Raman spectroscopy
    Hinrichs, K
    Schierhorn, A
    Haier, P
    Esser, N
    Richter, W
    Sahm, J
    PHYSICAL REVIEW LETTERS, 1997, 79 (06) : 1094 - 1097
  • [8] Raman spectroscopy of optical phonons confined in semiconductor quantum dots and nanocrystals
    Rolo, A. G.
    Vasilevskiy, M. I.
    JOURNAL OF RAMAN SPECTROSCOPY, 2007, 38 (06) : 618 - 633
  • [9] Study of phonons in semiconductor superlattices by Raman scattering spectroscopy and microscopic model calculation
    Indiana Univ of Pennsylvania, Indiana, United States
    Mater Sci Eng B Solid State Adv Technol, 1-3 (143-146):
  • [10] Study of phonons in semiconductor superlattices by Raman scattering spectroscopy and microscopic model calculation
    Talwar, DN
    Roughani, B
    Pellegrino, JG
    Amirtharaj, P
    Qadri, SB
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3): : 143 - 146