Structure quality determination of the Hg1-xCdxTe thin films

被引：0
|
作者：
Yu, Fuju [1 ]
机构：
[1] Shanghai Inst. of Technical Physics, Shanghai, China
来源：
Proceedings of SPIE - The International Society for Optical Engineering | 1994年 / 2364卷
基金：
中国国家自然科学基金;
关键词：
Crystal structure - Mercury compounds - Semiconducting cadmium compounds - Semiconducting tellurium compounds - Thin films;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The study of lattice mismatch strain, composition mutation in Hg 1-xCdxTe thin films, and intensive strain field which created from substrate and acrossed all epilayers was nondestructively carried out by X-ray double crystal diffraction and X-ray topography.
引用
收藏
页码：88 / 92
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