X-ray diffraction study of lattice parameters for layered compounds MxTaS2 (M = Tl or In)

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J Phys Condens Matter | / 24卷 / 4625期

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[1] X-RAY-DIFFRACTION STUDY OF LATTICE-PARAMETERS FOR LAYERED COMPOUNDS M(X)TAS(2) (M=TL OR IN)
TAKEDA, T
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OHSHIMA, K
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[2] X-RAY DIFFRACTION MEASUREMENT OF LATTICE PARAMETERS OF IN2SE3
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CELUSTKA, B
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[3] STUDY OF LATTICE DEFECT IN MARTENSITE BY X-RAY DIFFRACTION .2.
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[4] A STUDY ON LATTICE DISTORTION BY AN X-RAY DIFFRACTION TECHNIQUE
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[10] X-ray diffraction study of ternary layered compounds in the PbSe-Bi2Se3 system
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