Contactless measurement of minority carrier diffusion length and hall mobility of GaAs and AlxGa1-xAs epitaxial layer

被引：0
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作者：
Wang, Zongxin [1 ]
Chu, Youling [1 ]
机构：
[1] Fudan Univ, Shanghai, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1996年 / 17卷 / 08期
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页码：583 / 588
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