All-NbN single flux quantum circuits based on NbN/AlN/NbN tunnel junctions

We report on the fabrication and operation of all-NbN single flux quantum (SFQ) circuits with resistively shunted NbN/AlN/NbN tunnel junctions fabricated on silicon substrates. The critical current varied by about ±5% in 400 NbN/AlN/NbN junction arrays, where the junction area was 8×8 μm2. Critical current densities of the NbN/AlN/NbN tunnel junctions showed exponential dependence on the deposition time of the AlN barrier. By using the 12-nm-thick Cu film as shunted resistors, non-hysteretic current-voltage characteristics were achieved. From dc-SQUID measurements, the sheet inductance of our NbN stripline was estimated to be around 1.2 pH at 4.2 K. We designed and fabricated circuits consisting of dc/SFQ converters, Josephson transmission lines, and T flip-flop-based SFQ/dc converters. The circuits demonstrated correct operation with a bias margin of more than ±15% at 4.2 K.