Engineering risk assessment in manufacturing products with short time-to-market windows

被引：0

作者：

Martinez-Heath, M.R. ^{[1
]}

Deacon, A.G. ^{[1
]}

机构：

[1] AT&T Bell Lab, Holmdel, United States

来源：

Journal of engineering for industry | 1995年 / 117卷 / 01期

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D O I：

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摘要：

引用

页码：49 / 54

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