EMISSIVITY MEASUREMENT FOR OUTDOOR STRUCTURES.

被引:0
|
作者
Surin, V.G.
机构
关键词
COATED PLATES - HEAT LOSSES - TEMPERATURE GRADIENT - THERMAL CONTACT;
D O I
暂无
中图分类号
学科分类号
摘要
Low-emissivity coatings are used to control thermal conditions in structures and reduce heat losses; the emissivity alters during use because of environmental factors, so periodic measurements are required directly on the coating. Existing methods of determining the emissivity epsilon are designed mainly for laboratory conditions. A radiometric method was proposed for measuring emissivity from the functional relationship between the brightness of the emission from a source and the temperature. We have tested this method under field conditions.
引用
收藏
页码:148 / 150
相关论文
共 50 条
  • [1] EMISSIVITY MEASUREMENT FOR OUTDOOR STRUCTURES
    SURIN, VG
    MEASUREMENT TECHNIQUES USSR, 1987, 30 (02): : 148 - 150
  • [2] How to build outdoor structures.
    Hershey, JN
    LIBRARY JOURNAL, 2002, 127 (14) : 209 - 209
  • [3] DISCHARGE MEASUREMENT STRUCTURES.
    Boa, M.G., 1600,
  • [4] SURFACE PHOTOVOLTAGE MEASUREMENT IN MOS STRUCTURES.
    Pater, K.
    Applied physics. A, Solids and surfaces, 1987, A44 (02): : 191 - 194
  • [5] THICKNESS MEASUREMENT OF THIN FILMS IN MULTILAYER STRUCTURES.
    DiGiacomo, G.
    IBM Technical Disclosure Bulletin, 1974, 16 (11): : 3604 - 3605
  • [6] Power measurement of flexural waves in structures. Intensity in beams
    Kurtz, P.
    Proceedings - International Conference on Noise Control Engineering, 1988,
  • [7] Measurement of spontaneous emission spectra of diode laser structures.
    Lewis, GM
    Smowton, PM
    Thomson, JD
    Summers, HD
    Blood, P
    LEOS 2001: 14TH ANNUAL MEETING OF THE IEEE LASERS & ELECTRO-OPTICS SOCIETY, VOLS 1 AND 2, PROCEEDINGS, 2001, : 655 - 656
  • [8] An Outdoor Measurement Technique for Large Structures Antennas
    Diakite, C.
    Lanteri, J.
    Migliaccio, C.
    2017 IEEE CONFERENCE ON ANTENNA MEASUREMENTS & APPLICATIONS (CAMA), 2017, : 16 - 19
  • [9] MEASUREMENT OF THE DOPANT DISTRIBUTION IN THIN EPITAXIAL SI AND GaAs STRUCTURES.
    Gottwald, Peter
    Ambrozy, Andras
    Periodica Polytechnica Electrical Engineering, 1980, 24 (1-2): : 11 - 18
  • [10] Emissivity measurement
    Paquette, DG
    AMERICAN CERAMIC SOCIETY BULLETIN, 1999, 78 (12): : 27 - 27