Time-saving testing scheme for mask-ROM based on structure-oriented failures

被引：0
|
作者：
Wu, Tsung-Chih [1 ]
Lee, Chung-Len [1 ]
机构：
[1] United Microelectronics Corp, Hsinchu, Taiwan
来源：
| 1994年
关键词：
ROM;
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摘要：
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页码：72 / 77
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