Method of measuring roundness error based on slit diffraction

被引：0
|
作者：
Hua, Shi-Qun [1 ]
Luo, Ying [1 ]
Zhao, Guo-Qi [1 ]
机构：
[1] Faculty of Science, Jiangsu University, Zhenjiang 212013, China
来源：
Guangdian Gongcheng/Opto-Electronic Engineering | 2007年 / 34卷 / 03期
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页码：140 / 144
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