Observation of low angle grain boundaries and micropipes in 6H-SiC single crystal by synchrotron radiation black reflection white-beam topography

被引：0
|
作者：
Jiang, Shou-Zhen [1 ]
Huang, Xian-Rong [2 ]
Hu, Xiao-Bo [1 ]
Li, Juan [1 ]
Chen, Xiu-Fang [1 ]
Wang, Ying-Min [1 ]
Ning, Li-Na [1 ]
Xu, Xian-Gang [1 ]
Jiang, Min-Hua [1 ]
机构：
[1] State Key Laboratory of Crystal Materials, Shandong University, Ji'nan 250100, China
[2] Department of Materials Science and Engineering, State University of New York at Stony Brook, New York 11794, United States
来源：
Gongneng Cailiao/Journal of Functional Materials | 2006年 / 37卷 / 12期
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页码：1985 / 1987
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