Characterization of polycrystalline silicon thin-film transistors

被引：0
|
作者：
Sameshima, Toshiyuki [1 ]
Kimura, Mutsumi [2 ]
机构：
[1] Tokyo University of Agriculture and Technology, 2-24-16, Naka-cho, Koganei, Tokyo 184-8588, Japan
[2] Ryukoku University, Seta, Otsu 520-2194, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2006年 / 45卷 / 3 A期
关键词：
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摘要：
Journal article (JA)
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页码：1534 / 1539
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