Effect of defect size on the measurement of defect depth using thermal wave imaging

被引：0
|
作者：
Zeng, Zhi [1 ,2 ]
Tao, Ning [2 ]
Feng, Lichun [2 ]
Zhang, Cunlin [2 ]
机构：
[1] Institute of Physics and Electronic Engineering, Chongqing Normal University, Chongqing 400047, China
[2] Key Laboratory of Terahertz Optoelectronics, Department of Physics, Capital Normal University, Beijing 100048, China
来源：
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2012年 / 41卷 / 07期
关键词：
Defects - Thickness gages - Fiber reinforced plastics - Diffusion - Heat conduction;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：1910 / 1915
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