Simulation of hub flaw X-ray images

被引：0
|
作者：
Huang, Qian [1 ]
Ou, Yanhua [1 ]
机构：
[1] School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510641, China
来源：
Shuju Caiji Yu Chuli/Journal of Data Acquisition and Processing | 2007年 / 22卷 / 04期
关键词：
10;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：475 / 478
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