Study on reason of destruction in YBCO thin film during current limiting and improvement of the performance in current limiting

被引：0
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作者：
Ootani, Akifumi [1 ,3 ]
Hori, Tetsuo [1 ,3 ]
Endo, Mikihiko [1 ,3 ]
Furuse, Mitsuho [2 ,4 ]
Yamaguchi, Iwao [2 ,4 ]
Kaiho, Katsuyuki [2 ,4 ]
Yanabu, Satoru [1 ,3 ]
机构：
[1] Tokyo Denki University, 2-2, Nishikichou-Kanda, Chiyoda-ku, Tokyo 101-8457
[2] National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Umezono, Tsukuba 305-8568
[3] Tokyo Denki University
[4] National Institute of Advanced Industrial Science and Technology (AIST)
来源：
IEEJ Transactions on Power and Energy | 2007年 / 127卷 / 03期
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D O I：
10.1541/ieejpes.127.515
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页码：515 / 521
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