An analytical method to study the effects of a substrate in surface-enhanced Raman scattering

被引：0
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作者：
Huang, Shao Ying [1 ,2 ]
Wu, Bae-Ian [1 ]
Zhang, Baile [1 ]
Lee, Yee Hui [2 ]
Liberman, Vladimir [3 ]
Rothschild, Mordechai [3 ]
机构：
[1] Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139-4307, United States
[2] School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore
[3] Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02420, United States
来源：
Journal of Applied Physics | 2009年 / 106卷 / 11期
关键词：
In studies of surface-enhanced Raman scattering (SERS); individual metal nanoparticle and particle assemblies introduce enhancement of electromagnetic fields. However; the contributions to enhancement due to the substrate supporting the particles are yet to be studied analytically. In this communication; we present an analytical method to investigate the effect of a substrate with realistic layers in SERS. The proposed method quantifies the effect of a substrate on the electric field on the nanoparticles surface in SERS experiments. By applying the proposed method; optimal constructions of a substrate can be obtained to maximize the surface electric field while a poorly constructed one can be avoided. The maximization can lead to a high Raman enhancement factor. The method is verified using numerical simulations. © 2009 American Institute of Physics;
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