Nanotomography using ion and electron beams: A tool for analysis of complex formation and local degradation of microstructures

被引：0
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作者：
Mücklich, F. [1 ,2 ]
Engstler, M. [1 ]
机构：
[1] Lehrstuhl für Funktionswerkstoffe, Universität des Saarlandes, Saarbrücken, Germany
[2] Leiter des Steinbeis Forschungszentrums, Materials Engineering Center Saarland (MECS), Saarbrücken, Germany
来源：
HTM - Haerterei-Technische Mitteilungen | 2009年 / 64卷 / 05期
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页码：262 / 269
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