Electrical properties and microstructure of low-temperature-crystallized lead zirconate titanate thin films prepared by 2.45 GHz microwave irradiation

被引：0
|
作者：
Wang, Zhan Jie [1 ]
Otsuka, Yuka [2 ]
Cao, Zhiping [2 ]
Kokawa, Hiroyuki [2 ]
机构：
[1] Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China
[2] Department of Materials Science and Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
来源：
Japanese Journal of Applied Physics | 2009年 / 48卷 / 9 Part 2期
关键词：
Coercive field - Crystalline phasis - Electrical properties and microstructure - Lead zirconate titanate thin films - Low temperatures - Perovskite phase - PZT thin film - Rosette structure;
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页码：011 / 09
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