Test goes lean with boundary scan

被引：0
|
作者：
Plunkett, Dominic [1 ,2 ]
机构：
[1] XJTAG
[2] XJAnalyzer, XJTAG, Cambridge, United Kingdom
来源：
SMT Surface Mount Technology Magazine | 2007年 / 21卷 / 02期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Boundary scan: The Internet of test
    Wondolowski, M
    Bennetts, B
    Ley, A
    IEEE DESIGN & TEST OF COMPUTERS, 1999, 16 (03): : 34 - 43
  • [2] Boundary scan test standards
    Ashenden, PJ
    IEEE DESIGN & TEST OF COMPUTERS, 2003, 20 (01): : 91 - 92
  • [3] Boundary scan test in practice
    Australian Electronics Engineering, 1992, 24 (04):
  • [4] Boundary scan goes beyond board-level testing
    Stoel, C
    ELECTRONIC PRODUCTS MAGAZINE, 1997, 39 (08): : 37 - 38
  • [5] Embedded test complements boundary scan
    Nelson, Rick
    EE: Evaluation Engineering, 2012, 51 (10): : 22 - 26
  • [6] THE IMPACT OF BOUNDARY SCAN ON BOARD TEST
    PARKER, KP
    IEEE DESIGN & TEST OF COMPUTERS, 1989, 6 (04): : 18 - 30
  • [7] WORKING WITH BOUNDARY-SCAN TEST
    BISHOP, L
    ELECTRONIC PRODUCTS MAGAZINE, 1993, 35 (10): : 65 - 71
  • [8] Reducing the cost of test with boundary scan
    Goepel, H
    EE-EVALUATION ENGINEERING, 2004, 43 (01): : 28 - 33
  • [9] Using boundary-scan test
    de Jong, Frans, 1600, (29):
  • [10] Matsushita uses boundary scan test
    Test & Measurement World, 1995, 15 (02):
12345