High precision wavefront reconstruction technology for single interferogram

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作者：
Shanxi Province Key Lab of Thin Film Technology and Optical Test, Xi'an Technological University, Xi'an [1 ]
710032, China
机构：
来源：
Hongwai yu Jiguang Gongcheng Infrared Laser Eng. | / 4卷 / 1203-1207期
关键词：
Compendex;
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摘要：
Fourier transforms
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