Software cost model with variable fault removal efficiency and fault occurrence rate

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作者：
Inst. of Electronic Science and Technology, Univ. of Electronic Science and Technology of China, Chengdu 610054, China [1 ]
不详 [2 ]
不详 [3 ]
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来源：
Xi Tong Cheng Yu Dian Zi Ji Shu/Syst Eng Electron | 2007年 / 11卷 / 1962-1964+1968期
关键词：
Software reliability;
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