共 50 条
- [1] Reinvestigation of Ni3TeO6 ACTA CRYSTALLOGRAPHICA SECTION E-STRUCTURE REPORTS ONLINE, 2006, 62 : I222 - I223
- [10] In situ studies of semiconductor growth by synchrotron X-ray diffraction NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 246 (01): : 50 - 57