A compact and rugged tunable external cavity diode laser with Littman-Metcalf configuration

被引:0
|
作者
Wei, Fang [1 ,2 ]
Chen, Dijun [1 ]
Xin, Guofeng [1 ]
Sun, Yanguang [1 ,2 ]
Fang, Zujie [1 ]
Cai, Haiwen [1 ]
Qu, Ronghui [1 ]
机构
[1] Shanghai Key Laboratory of All Solid-State Laser and Applied Techniques, Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
[2] University of Chinese Academy of Sciences, Beijing 100049, China
来源
关键词
Frequency stability - Hinges - Laser resonators - Semiconductor lasers;
D O I
10.3788/CJL201340.1102012
中图分类号
学科分类号
摘要
An external cavity diode laser (ECDL) with Littman-Metcalf configuration is constructed in this paper. The ECDL adopts a compact structure with a star-flexure hinge as the tuning mechanism. Its mechanical characteristics and design are analyzed and optimized by finite element calculations. The first order resonance frequency of tuning arm is measured as 3.7 kHz. The laser cavity structure parameters are designed according to the mode-hop-free tuning condition, and the performance of the ECDL is obviously improved, showing single-mode operation with mode-hopping free tuning range over 80 GHz at 780 nm. The device has been operating stably without realignment for more than one year, indicating its good ruggedness. The frequency of ECDL can be locked at 87Rb (F=2→F′=2, 3) transitions. The linewidth of 200 kHz and temperature stability of 35 MHz/°C are measured, and the Allen deviation reaches 3.5×10-11 in 3-s integration time. Its output power is continuously monitored with fluctuation below 0.75% for 24 h, showing with good stability.
引用
收藏
相关论文
共 50 条
  • [1] Polarization Characteristics of an External Cavity Diode Laser With Littman-Metcalf Configuration
    Chen, Dijun
    Fang, Zujie
    Cai, Haiwen
    Qu, Ronghui
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2009, 21 (14) : 984 - 986
  • [2] A compact external-cavity diode laser with a Littman configuration
    Park, SE
    Shin, EJ
    Kwon, TY
    Lee, HS
    2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST, 2002, : 472 - 473
  • [3] Compact tunable diode laser with diffraction limited 1000 mW in Littman/Metcalf configuration for cavity ring-down spectroscopy
    Stry, S
    Sacher, J
    Thelen, S
    Halmer, D
    Hering, P
    Mürtz, M
    HIGH-POWER DIODE LASER TECHNOLOGY AND APPLICATIONS IV, 2006, 6104
  • [4] Optimal design for reducing diffraction loss of Littman-Metcalf grating external cavity semiconductor laser
    Zhou P.
    Wu Y.
    Zhang R.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2023, 52 (01):
  • [5] Widely tunable diffraction limited 1000 mW external cavity diode laser in Littman/Metcalf configuration for cavity ring-down spectroscopy
    Stry, S.
    Thelen, S.
    Sacher, J.
    Halmer, D.
    Hering, P.
    Muertz, M.
    APPLIED PHYSICS B-LASERS AND OPTICS, 2006, 85 (2-3): : 365 - 374
  • [6] Widely tunable diffraction limited 1000 mW external cavity diode laser in Littman/Metcalf configuration for cavity ring-down spectroscopy
    S. Stry
    S. Thelen
    J. Sacher
    D. Halmer
    P. Hering
    M. Mürtz
    Applied Physics B, 2006, 85 : 365 - 374
  • [7] Frequency scanning of a laser with a Littman-Metcalf cavity using an electrooptic deflector
    Vasil'ev, SV
    Ivleva, LI
    Sychugov, VA
    QUANTUM ELECTRONICS, 2001, 31 (09) : 825 - 828
  • [8] Influence of the misalignment of the collimating lens on the line-width of Littman-Metcalf grating external cavity laser
    Zhou P.
    Wu Y.
    Zhang R.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2022, 51 (04):
  • [9] MEMS tunable Littman-Metcalf diode laser at 2.2μm for rapid broadband spectroscopy in aqueous solutions
    Torcheboeuf, N.
    Droz, S.
    Simonyte, I.
    Miasojedovas, A.
    Trinkunas, A.
    Vizbaras, K.
    Vizbaras, A.
    Boiko, D. L.
    2018 IEEE INTERNATIONAL SEMICONDUCTOR LASER CONFERENCE (ISLC), 2018, : 185 - 186
  • [10] A compact extended-cavity diode laser with a Littman configuration
    Park, SE
    Kwon, TY
    Shin, EJ
    Lee, HS
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (02) : 280 - 283