Structure Property Relationship in BaTiO3-Na0.5Bi0.5TiO3-Nb2O5-NiO X8R System

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[1] [1,Sun, Yue
[2] Liu, Hanxing
[3] Hao, Hua
[4] Song, Zhe
[5] Zhang, Shujun
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Liu, Hanxing (lhxhp@whut.edu.cn) | 1600年 / Blackwell Publishing Inc., Postfach 10 11 61, 69451 Weinheim, Boschstrabe 12, 69469 Weinheim, Deutschland, 69469, Germany卷
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A novel BaTiO3-Na0.5Bi0.5TiO3-Nb2O5-NiO (BT-NBT-Nb-Ni) system that meets the X8R specification (-55°C-150°C; ΔC/C≤±15%) of multilayer ceramic capacitors (MLCCs) was fabricated; with a maximum dielectric constant of 2350 at room temperature (25°C). Core-shell microstructure was observed by transmission electron microscopy (TEM); accounting for the good dielectric temperature stability. The role of Ni on the formation of core-shell structure and phase structure; and the subsequent relationship between structure and dielectric/ionic conduction properties were investigated. It was observed that the addition of Ni could adjust the ratio of core/shell; and significantly reduces the dielectric loss over the studied temperature range. A new Ba11(Ni; Ti)28O66+x phase with a 10-layer close-packed structure was identified by X-ray diffraction (XRD); serving as a source of oxygen vacancies for ionic conduction in addition to Ba(Ni; Ti)O3; Furthermore; the impedance spectroscopy measurements demonstrated the remarkable impact of these Ni-induced oxygen vacancies on both the grain and grain-boundary conductivities. © 2015 The American Ceramic Society;
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