Characteristics of background radiation of shortwave infrared imaging spectrometer based on AOTF

被引：0
|
作者：
Zhu, Qian [1 ,2 ]
Wang, Yueming [1 ]
Wang, Jianyu [1 ]
Zhuang, Xiaoqiong [1 ]
机构：
[1] Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
[2] Graduate University of the Chinese Academy of Sciences, Beijing 100049, China
来源：
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2012年 / 41卷 / 03期
关键词：
Compendex;
D O I：
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学科分类号：
摘要：
Radiation
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收藏
页码：575 / 579
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