Automatic High-Resolution Operational Modal Identification of Thin-Walled Structures Supported by High-Frequency Optical Dynamic Measurements

被引:0
|
作者
Deng, Tongfa [1 ,2 ]
Wang, Yuexin [1 ,2 ]
Huang, Jinwen [1 ,2 ,3 ]
Cao, Maosen [1 ,3 ]
Sumarac, Dragoslav [1 ,4 ]
机构
[1] Jiangxi Univ Sci & Technol, Sch Civil & Surveying & Mapping Engn, Ganzhou 341000, Peoples R China
[2] Jiangxi Univ Sci & Technol, Jiangxi Prov Key Lab Environm Geotech Engn & Hazar, Ganzhou 341000, Peoples R China
[3] Hohai Univ, Coll Mech & Engn Sci, Nanjing 211100, Peoples R China
[4] State Univ Novi Pazar, Dept Tech Sci Civil Engn, Novi Pazar 36300, Serbia
关键词
thin-walled structure; optical dynamic measurement; automated operational modal identification; clustering algorithm;
D O I
10.3390/ma17204999
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High-frequency optical dynamic measurement can realize multiple measurement points covering the whole surface of the thin-walled structure, which is very useful for obtaining high-resolution spatial information for damage localization. However, the noise and low calculation efficiency seriously hinder its application to real-time, online structural health monitoring. To this end, this paper proposes a novel high-resolution frequency domain decomposition (HRFDD) modal identification method, combining an optical system with an accelerometer for measuring high-accuracy vibration response and introducing a clustering algorithm for automated identification to improve efficiency. The experiments on the cantilever aluminum plate were carried out to evaluate the effectiveness of the proposed approach. Natural frequency and damping ratios were obtained by the least-squares complex frequency domain (LSCF) method to process the acceleration responses; the high-resolution mode shapes were acquired by the singular value decomposition (SVD) processing of global displacement data collected by high-speed cameras. Finally, the complete set of the first nine order modal parameters for the plate within the frequency range of 0 to 500 Hz has been determined, which is closely consistent with the results obtained from both experimental modal analysis and finite element analysis; the modal parameters could be automatically picked up by the DBSCAN algorithm. It provides an effective method for applying optical dynamic technology to real-time, online structural health monitoring, especially for obtaining high-resolution mode shapes.
引用
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页数:26
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共 37 条
  • [1] Scattering of high-frequency wave by a thin-walled plane rigidly supported inclusion
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