Investigation of Voltage Regulator Module (VRM)-Induced Noise to High-Speed Signals with VRM via Design Factors

被引:0
|
作者
Joo, Junho [1 ]
Mathew, Manish K. [1 ]
Chada, Arun [2 ]
Singh, Soumya [3 ]
Pk, Seema [3 ]
Mutnury, Bhyrav [2 ]
Kim, Donghyun [1 ]
机构
[1] Missouri University of Science and Technology, EMC Laboratory, Rolla,MO,65409, United States
[2] Dell, Enterprise Product Group, Round Rock,TX,78682, United States
[3] Dell, Enterprise Product Group, Bangalore,560048, India
关键词
Compendex;
D O I
10.1109/TSIPI.2024.3407030
中图分类号
学科分类号
摘要
Field effect transistors - Printed circuit boards - Three dimensional displays - Timing circuits - Voltage regulators
引用
收藏
页码:97 / 109
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