Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction

被引:0
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作者
Lu, Thomas [1 ]
Lu, Albert [1 ]
Wong, Hiu Yung [1 ]
机构
[1] San Jose State University, M-PAC Lab., San Jose, United States
关键词
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
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学科分类号
摘要
Drain current - Electronic design automation - Forecasting - Inverse problems - Learning systems - Machine learning - MOS devices - Oxide semiconductors
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页码:161 / 164
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