A fluorite-structured HfO2/ZrO2/HfO2 superlattice based self-rectifying ferroelectric tunnel junction synapse

被引:2
|
作者
Lee, Dong Hyun [1 ,2 ]
Kim, Ji Eun [3 ]
Cho, Yong Hyeon [1 ,2 ]
Kim, Sojin [4 ]
Park, Geun Hyeong [1 ,2 ]
Choi, Hyojun [1 ,2 ]
Lee, Sun Young [1 ,2 ]
Kwon, Taegyu [1 ,2 ]
Kim, Da Hyun [1 ,2 ]
Jeong, Moonseek [1 ,2 ]
Jeong, Hyun Woo [1 ,2 ]
Lee, Younghwan [5 ]
Lee, Seung-Yong [4 ]
Yoon, Jung Ho [6 ]
Park, Min Hyuk [1 ,2 ,7 ]
机构
[1] Seoul Natl Univ, Coll Engn, Dept Mat Sci & Engn, Seoul 08826, South Korea
[2] Seoul Natl Univ, Coll Engn, Inter Univ Semicond Res Ctr, Seoul 08826, South Korea
[3] Korea Inst Sci & Technol KIST, Elect Mat Res Ctr, Seoul 02792, South Korea
[4] Hanyang Univ, Div Mat Sci & Engn, Seoul 04763, South Korea
[5] Chonnam Natl Univ, Dept Mat Sci & Engn, Gwangju 61186, South Korea
[6] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea
[7] Seoul Natl Univ, Inst Engn Res, Coll Engn, Gwanak Ro 1, Seoul 08826, South Korea
基金
新加坡国家研究基金会;
关键词
HAFNIUM OXIDE; THIN-FILMS; LOW-POWER; DEVICES; HFO2; RRAM;
D O I
10.1039/d4mh00519h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A self-rectifying ferroelectric tunnel junction that employs a HfO2/ZrO2/HfO2 superlattice (HZH SL) combined with Al2O3 and TiO2 layers is proposed. The 6 nm-thick HZH SL effectively suppresses the formation of non-ferroelectric phases while increasing remnant polarization (P-r). This enlarged P-r modulates the energy barrier configuration, consequently achieving a large on/off ratio of 1273 by altering the conduction mechanism from off-state thermal injection to on-state Fowler-Nordheim tunneling. Moreover, the asymmetric Schottky barriers at the top TiN/TiO(2)and bottom HfO2/Pt interfaces enable a self-rectifying property with a rectifying ratio of 1550. Through calculations and simulations it is found that the device demonstrates potential for achieving an integrated array size exceeding 7k while maintaining a 10% read margin, and shows potential for application in artificial synapses for neuromorphic computing with an image recognition accuracy above 92%. Finally, the self-rectifying behavior and device-to-device variation reliability are confirmed in a 9 x 9 crossbar array structure.
引用
收藏
页码:5251 / 5264
页数:15
相关论文
共 50 条
  • [1] Synapse and resistance switching behavior of La:HfO2/ZrO2/La:HfO2 memristors
    Su, Yong-Jun
    Jiang, Yan-Ping
    Tang, Jia-Yu
    Tang, Xin-Gui
    Tang, Zhenhua
    Guo, Xiao-Bin
    Li, Wen-Hua
    Zhou, Yichun
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2025,
  • [2] HfO2 self-rectifying selector in RRAM array
    Zhang, Xinlei
    Ji, Hao
    Jiang, Ran
    2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2018, : 515 - 517
  • [3] BEoL Varactors Based on HfO2/ZrO2 Superlattice for mmWave Applications
    Abdulazhanov, Sukhrob
    Le, Quang Huy
    Lehninger, David
    Suenbuel, Ayse
    Kaempfe, Thomas
    Gerlach, Gerald
    2024 50TH IEEE EUROPEAN SOLID-STATE ELECTRONICS RESEARCH CONFERENCE, ESSERC 2024, 2024, : 245 - 248
  • [4] Electronic structure of ZrO2 and HfO2
    Perevalov, TV
    Shaposhnikov, AV
    Nasyrov, KA
    Gritsenko, DV
    Gritsenko, VA
    Tapilin, VM
    DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES, 2006, 220 : 423 - +
  • [5] Thermal Expansion of HfO2 and ZrO2
    Haggerty, Ryan P.
    Sarin, Pankaj
    Apostolov, Zlatomir D.
    Driemeyer, Patrick E.
    Kriven, Waltraud M.
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2014, 97 (07) : 2213 - 2222
  • [6] ON THE DEFECT STRUCTURE OF ZRO2 AND HFO2
    KOFSTAD, P
    RUZICKA, DJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (03) : 181 - 184
  • [7] ON THE DEFECT STRUCTURE OF ZRO2 AND HFO2
    HARROP, PJ
    WANKLYN, JN
    KOFSTAD, P
    RUZICKA, DJ
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (12) : 1285 - 1286
  • [8] THE CRYSTAL STRUCTURE OF ZRO2 AND HFO2
    ADAM, J
    ROGERS, MD
    ACTA CRYSTALLOGRAPHICA, 1959, 12 (11): : 951 - 951
  • [9] Accelerated ferroelectric phase transformation in HfO2/ZrO2 nanolaminates
    Migita, Shinji
    Ota, Hiroyuki
    Asanuma, Shutaro
    Morita, Yukinori
    Toriumi, Akira
    APPLIED PHYSICS EXPRESS, 2021, 14 (05)
  • [10] Designing Wake-Up Free Ferroelectric Capacitors Based on the HfO2/ZrO2 Superlattice Structure
    Bai, Na
    Xue, Kan-Hao
    Huang, Jinhai
    Yuan, Jun-Hui
    Wang, Wenlin
    Mao, Ge-Qi
    Zou, Lanqing
    Yang, Shengxin
    Lu, Hong
    Sun, Huajun
    Miao, Xiangshui
    ADVANCED ELECTRONIC MATERIALS, 2023, 9 (01)