Feature assortment for deep learning-based bug localization with a program graph

被引：0
|
作者：
Kim, Youngkyoung [1 ]
Kim, Misoo [2 ]
Lee, Eunseok [3 ]
机构：
[1] Sungkyunkwan University, Department of Electrical and Computer Engineering, Suwon, Korea, Republic of
[2] Sungkyunkwan University, Institute of Software Convergence, Suwon, Korea, Republic of
[3] Sungkyunkwan University, College of Computing and Informatics, Suwon, Korea, Republic of
来源：
Proceedings of the ACM Symposium on Applied Computing | 2022年
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Trees (mathematics) - Abstracting - Deep learning - Java programming language - Open source software
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页码：1536 / 1544
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