Hidden Markov and independence models with patterns for sequential BIST

被引：0
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作者：
Brehelin, Laurent [1 ]
Gascuel, Olivier [1 ]
Caraux, Gilles [1 ]
Girard, Patrick [1 ]
Landrault, Christian [1 ]
机构：
[1] Lab d'Informatique, Montpellier, France
来源：
Proceedings of the IEEE VLSI Test Symposium | 2000年
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页码：359 / 367
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