Multiscales edges detection based on spline wavelet

被引：0
|
作者：
Sun, Y. [1 ]
Wu, Y.D. [1 ]
Hu, J.S. [1 ]
机构：
[1] Sch. of Electron. and Info. Eng., Dalian Univ. of Technol., Dalian 116024, China
来源：
Guangdianzi Jiguang/Journal of Optoelectronics Laser | 2001年 / 12卷 / 05期
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页码：525 / 528
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